Research Publications

Big GCVAE: Decision-making with Adaptive Transformer

Ezukwoke, K., et al. (2024). Journal of Intelligent Manufacturing

Advanced decision-making framework using adaptive transformers for semiconductor failure analysis. This research introduces a novel approach to handling complex failure patterns through adaptive transformer architectures.

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Leveraging Pre-trained Models for Failure Analysis

Ezukwoke, K., et al. (2022). arXiv preprint

Novel approach using pre-trained models for efficient failure analysis triplet generation. This work demonstrates significant improvements in analysis efficiency and accuracy.

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Root Cause Prediction with Genetic Algorithm-ML

Rammal, A., et al. (2023). Scientific Reports

Hybrid approach combining genetic algorithms with machine learning for root cause analysis. This innovative methodology provides robust failure prediction capabilities.

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NLP and Association Rules for Intelligent Fault Analysis

Ezukwoke, K., et al. (2023). IEEE Transactions on Semiconductor Manufacturing

Natural language processing and association rules for intelligent fault analysis in semiconductor manufacturing. This research explores text-based failure analysis methodologies.

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